Diamond Tip

SCD probes are single crystal diamond tips specially grown in CVD process and glued to silicon cantilevers for use in AFM. The growth technology provides durable probes with high aspect ratio and small tip radius by affordable price comparable to that of traditional silicon probes. After gluing, each tip passes quality control on SEM before packaging.

Beacuse of the high hardness of diamond, the tip can be used for surface modifications and measuring properties of hard materials like silicon, glass, metals, etc. The probe is highly resistant to wear, which is especially useful when fast scanning speed is needed, or when or when there are sharp and rigid edges on surface.

SEM image of single crystal diamond (SCD) tip for SPM. SEM image of the tip aspect ratio over 2 microns from the end. Full cone angle from 5° to 10°. SEM image of the SCD tip end. Tip radius less than 10 nm. Raman spectra of SCD tips. Thin diamond line at 1332 cm-1.

Tip material Single Crystal Diamond (SCD)
Tip radius 5-10 nm
Tip aspect ratio* more than 5:1
Tip full cone angle* less than 10°
SCD orientation <100> along the tip axis
*When measured at least on the last 1 µm of the tip end.

Glue type** Non-conducting
Glue temperature stability 70°C (160°F)
**The glue is chemically stable in water, ethanol, in presence of chloride ions, biological buffers (PBS, Hanks solution, etc); not stable in ketones, DMSO.

Download a brief catalog of diamond SCD probes for AFM:


SCD diamond tip is:
 • Long life and forgiving AFM operation mistakes, advantageous when tip replacement is hard or time-taking
 • Used for nanoindentation, mapping properties of hard materials and material contrast
 • Used for scratching and pulse force lithography on hard materials1
 • Used for imaging high aspect ratio features on surface
 • Applicable to measuring magnetic fields with high sensitivity via photo luminescence detection2

It was also reported that SCD probes can be used for long-time scanning of sticky biological samples without contamination, which can be related to the low surface energy of diamond >>>.

1. A. Temiryazev. Pulse force nanolithography on hard surfaces using atomic force microscopy with a sharp single-crystal diamond tip. Diamond & Related Materials 48 (2014) 6064. arXiv:1312.0796
2. R. Nelz et al, Color center fluorescence and spin manipulation in single crystal, pyramidal diamond tips. arXiv:1608.08369


SCD diamond probes are glued onto rectangular (diving-board) silicon etched cantilevers. The range of spring constants and resonant frequencies of cantilevers available covers the Contact mode, Force Modulation, Non-Contact and Tapping mode. Cantilever backside is coated by Aluminium.

The chip holder size is 1.6 mm x 3.4 mm x 0.4 mm.

Part Number Resonant Frequency, kHz Spring Constant, N/m AFM mode
0.15 Contact mode
3.5 Tapping mode. Force modulation. Contact mode.
Imaging in a liquid cell.
ART D160
5 Tapping mode. Contact mode on hard surfaces.
ART D300
40 Tapping mode. Non-contact mode.
Contact mode on hard surfaces.
Nanoindentation. Force nanolithography.
Note: The glue used to attach the tip to the cantilever is not conducting, so the probe is not applicable for conductive AFM measurements. Values for resonant frequencies and spring constants are typical.


Probes are packaged by 5 or 10 per container.

Availability and Pricing

Price per pack of 10 is 750 Eur. Quantity discounts apply.
Smaller packs at lower price per tip may be available for a limited time period.
ART™ SCD probes are available in stock from our distributors in Germany and USA. © 2013-2014 ART™ technology of diamond growth and micromanipulation allows production of sharp long-life SPM probes. The diamond tips provide highly reproducible results in AFM imaging, nanoindentation and lithography. The production technology is flexible to changes. Welcome to contact us to modify the tip, the cantilever and the probe for your research the way you need.